An easily computed functional level testability measure

Abstract

The authors consider the problem of estimating the testability of a digital circuit at the functional level. Using an information-theoretic approach, they have developed a functional testability measure for both controllability and observability. They introduce two techniques that can efficiently and accurately estimate the measure. In addition, some applications of the testability measure for automated design for testability, such as automatic circuit partitioning and test point insertion, are described.<>