Phonon limited uniform transport in bilayer graphene transistors

A. Paussa, M. Bresciani, D. Esseni, P. Palestri, L. Selmi
{"title":"Phonon limited uniform transport in bilayer graphene transistors","authors":"A. Paussa, M. Bresciani, D. Esseni, P. Palestri, L. Selmi","doi":"10.1109/ESSDERC.2011.6044173","DOIUrl":null,"url":null,"abstract":"We report modeling results for low-field mobility and velocity saturation in bilayer graphene based on a newly developed semiclassical transport Monte-Carlo simulator validated by comparison with momentum relaxation time (MRT) calculations. We show that remote phonons originating in the dielectric stack are expected to strongly affect the mobility, although assessing their actual influence at high inversion charge requires the development of an accurate model for dynamic screening. When the applied bias opens the energy gap, the mobility is significantly reduced. The saturation velocity is expected to be as high as 3×107 cm/s and less degraded than mobility by bandgap opening.","PeriodicalId":161896,"journal":{"name":"2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2011.6044173","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

We report modeling results for low-field mobility and velocity saturation in bilayer graphene based on a newly developed semiclassical transport Monte-Carlo simulator validated by comparison with momentum relaxation time (MRT) calculations. We show that remote phonons originating in the dielectric stack are expected to strongly affect the mobility, although assessing their actual influence at high inversion charge requires the development of an accurate model for dynamic screening. When the applied bias opens the energy gap, the mobility is significantly reduced. The saturation velocity is expected to be as high as 3×107 cm/s and less degraded than mobility by bandgap opening.
双层石墨烯晶体管中声子限制的均匀输运
我们报告了基于新开发的半经典输运蒙特卡罗模拟器的双层石墨烯低场迁移率和速度饱和度的建模结果,并与动量松弛时间(MRT)计算进行了比较。我们表明,来自电介质堆栈的远程声子预计会强烈影响迁移率,尽管评估它们在高反转电荷下的实际影响需要开发一个准确的动态筛选模型。当施加的偏压打开能隙时,迁移率显着降低。饱和速度预计高达3×107 cm/s,并且比带隙打开对迁移率的影响更小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信