High-durability phase-shift film with variable transmittance

O. Nozawa, H. Shishido, Takenori Kajiwara
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引用次数: 5

Abstract

In order to maintain the lithographic margin and to have sufficient image resolution, attenuated phase shift masks are widely used as a resolution enhancement technique. To improve the radiation durability of the phase shift film, we have developed low oxidation MoSi shifters, such as A6L2, as one option for improving radiation durability. But to provide the best radiation durability, we have developed a new approach eliminating the molybdenum from the phase shift film and introduced a Silicon-Nitride (Si-N) based attenuated phase shift film. Traditionally the transmittance of the phase shift layer is usually around 6%. In the case of a pure Si3N4 film, the transmittance with 180 degree phase shift is around 18%. But, by controlling film structure with a combination of Si-N the transmittance can be tuned to the customers desired transmission value for high durability Mo free attenuated phase shift films.
具有可变透光率的高耐久性相移膜
为了保持光刻裕度并获得足够的图像分辨率,衰减相移掩模作为一种分辨率增强技术被广泛使用。为了提高相移膜的辐射耐久性,我们开发了低氧化MoSi移模,如A6L2,作为提高辐射耐久性的一种选择。但为了提供最佳的辐射耐久性,我们开发了一种新的方法,从相移膜中去除钼,并引入了一种基于氮化硅(Si-N)的衰减相移膜。传统上,相移层的透光率通常在6%左右。在纯氮化硅薄膜的情况下,180度相移的透射率约为18%。但是,通过与Si-N组合控制薄膜结构,可以将透射率调谐到客户期望的高耐久性无Mo衰减相移薄膜的透射值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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