{"title":"An ESD Case Study of Defect Analysis in High Speed Electronics Manufacturing","authors":"C. Almeras","doi":"10.23919/EOS/ESD.2018.8509738","DOIUrl":null,"url":null,"abstract":"A high volume, high speed manufacturer experienced component defects at a rate of 1 in every 30 boards. Failure signature was CDM–like. Root cause evaluation was undertaken to find the culprit/s and implement corrective actions. Details of the problem, investigation and corrective action are discussed in this paper.","PeriodicalId":328499,"journal":{"name":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"134 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EOS/ESD.2018.8509738","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A high volume, high speed manufacturer experienced component defects at a rate of 1 in every 30 boards. Failure signature was CDM–like. Root cause evaluation was undertaken to find the culprit/s and implement corrective actions. Details of the problem, investigation and corrective action are discussed in this paper.