W. Stadler, J. Niemesheim, Stefan Seidl, R. Gaertner, Toni Viheriaekoski
{"title":"The Risks of Electric Fields for ESD Sensitive Devices","authors":"W. Stadler, J. Niemesheim, Stefan Seidl, R. Gaertner, Toni Viheriaekoski","doi":"10.23919/EOS/ESD.2018.8509774","DOIUrl":null,"url":null,"abstract":"For objects with different sizes, distances and orientations to an electric field, potentials, charging, and discharge currents of the objects are measured in order to assess the ESD risk due to the E-field. The current rules in ANSI/ESD S20.20 and IEC 61340-5-1 might need an update to cover worst-case scenarios.","PeriodicalId":328499,"journal":{"name":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EOS/ESD.2018.8509774","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
For objects with different sizes, distances and orientations to an electric field, potentials, charging, and discharge currents of the objects are measured in order to assess the ESD risk due to the E-field. The current rules in ANSI/ESD S20.20 and IEC 61340-5-1 might need an update to cover worst-case scenarios.