A. García-Loureiro, N. Seoane, Julian G. Fernandez, E. Comesaña
{"title":"A general toolkit for advanced semiconductor transistors: from simulation to machine learning","authors":"A. García-Loureiro, N. Seoane, Julian G. Fernandez, E. Comesaña","doi":"10.1109/LAEDC58183.2023.10209112","DOIUrl":null,"url":null,"abstract":"This work presents an overview of a set of inhouse-built software intended for state-of-the-art semiconductor device modelling, ranging from simulators to post-processing tools and prediction codes based on statistics and machine learning techniques. First, VENDES is a 3D finite-element based quantum-corrected semi-classical/classical toolbox able to characterise the performance, scalability, and variability of transistors. MLFoMPy is a Python-based tool that post-processes IV characteristics, extracting the most relevant figures of merit and preparing the data for subsequent statistical or machine learning studies. FSM is a variability prediction tool that also pinpoints the most sensitive regions of a device to the source of fluctuation. Finally, we also describe machine learning-based prediction tools that were used to obtain full IV curves and specific figures of merit of devices suffering the influence of several sources of variability.","PeriodicalId":151042,"journal":{"name":"2023 IEEE Latin American Electron Devices Conference (LAEDC)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE Latin American Electron Devices Conference (LAEDC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LAEDC58183.2023.10209112","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This work presents an overview of a set of inhouse-built software intended for state-of-the-art semiconductor device modelling, ranging from simulators to post-processing tools and prediction codes based on statistics and machine learning techniques. First, VENDES is a 3D finite-element based quantum-corrected semi-classical/classical toolbox able to characterise the performance, scalability, and variability of transistors. MLFoMPy is a Python-based tool that post-processes IV characteristics, extracting the most relevant figures of merit and preparing the data for subsequent statistical or machine learning studies. FSM is a variability prediction tool that also pinpoints the most sensitive regions of a device to the source of fluctuation. Finally, we also describe machine learning-based prediction tools that were used to obtain full IV curves and specific figures of merit of devices suffering the influence of several sources of variability.