TC Reliability Enhancement Technology for SSD with Low Temperature Solder Paste Material

Junghoon Kim, Yong Jung, Eunho Oh, Y. Cinar, Jong-Seol Jeong, Sungki Lee, Jonggyu Park
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Abstract

The present study relates to the acquisition of optimal design and reliability enhancement technology using new solder paste material in the development process of new products in order to enter the SSD market with rapid customer response. As SAC paste material is reduced to about 70°C, the customer is able to reduce power and cost, CO2 emissions (35%), and PCB/Substrate warpage 50%. Based on these advantages, customer wants to lead a new industry change and are hoping for the generalization of the application of LTS solder paste material. In general, package causes process failure due to warpage at high and low temperature [1]. Warpage can be reduced by more than 50% from reflow peak temperature of LTS material. However, material bonding technology of SAC ball and LTS material SnBi paste of package is required. It is possible to improve the warpage of SSD set and array by lowering 70°C, but there is a disadvantage that the TAT of the reflow process increases. The SMT reflow profile is mainly managed by dividing it into ramp-up, soak range, and peak temp. In addition, it is necessary to build an additional assembly process line for customer’s LTS paste material application. Various DOE evaluations of peak temp. and duration were performed with the goal of reflow profile optimization. Under the TC 0-125°C conditions of DRAM module products, the reliability was weak due to hot tearing effect in close proximity to melting temp. 138°C of Bi paste. First, BMR 42.1% was confirmed under 180°C and 50sec conditions, and 900cycle defect occurred. Second, to improve this, the duration of the peak temperature section was increased from 50 to 120sec. BMR was confirmed to be 53.8% at 180°C and 120sec, and 1, 200cycle passed. Under the TC -40-85°C conditions of SSD M.2 products, the existing SAC paste failed at 2, 000cycle, but the LTS paste of S/PB material passed at 3, 024cycle and it has been improved by about 50% compared to mass production solder paste.
基于低温锡膏材料的固态硬盘TC可靠性增强技术
本研究涉及在新产品开发过程中,采用新型锡膏材料获取优化设计和可靠性增强技术,从而以快速的客户响应进入固态硬盘市场。由于SAC粘贴材料降低到约70°C,客户能够降低功耗和成本,二氧化碳排放量(35%)和PCB/基板翘曲50%。基于这些优势,客户希望引领新的行业变革,并希望推广LTS焊膏材料的应用。一般情况下,包装在高温和低温下会因翘曲而导致工艺失效[1]。从LTS材料的回流峰温度可以减少50%以上的翘曲。但需要SAC球与封装的LTS材料SnBi浆料的材料粘接技术。降低70℃可以改善SSD组和阵列的翘曲,但缺点是回流过程的TAT增加。SMT回流曲线主要通过将其划分为爬坡、浸泡范围和峰值温度来管理。此外,有必要为客户的LTS粘贴材料应用建立额外的组装工艺线。以回流曲线优化为目标,对峰值温度和持续时间进行了各种DOE评估。DRAM模组产品在TC 0 ~ 125℃条件下,在Bi膏体熔点138℃附近存在热撕裂效应,可靠性较弱。首先,在180°C和50sec条件下,BMR确认为42.1%,出现900循环缺陷。其次,为了改善这一点,将峰值温度段的持续时间从50秒增加到120秒。在180℃、120秒、1200个循环中,BMR为53.8%。在SSD M.2产品的TC -40-85℃条件下,现有的SAC膏体在2000次循环时失效,而S/PB材料的LTS膏体在3024次循环时通过,比量产的锡膏提高了约50%。
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