Investigation of a lead-free flip chip assembly process

G. Kums, N. Duan, J. Scheer, M. van Kleef, J. Wijers, J. Bielen
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Abstract

The integration of passive components into a single chip was developed to meet the increasing demands on cost and size reduction of the current RF power amplifier modules. Flip chip assembly on a laminate substrate using lead-free solder bumps was used for the module level assembly. In this paper, the detailed investigation of the assembly process is reported. This includes, among others, solder paste printing, flip chip placement and underfill application. The challenge of this flip chip assembly was the lead-free processing in both first level and second level interconnects and the required short throughput time from the pre-development to the mass production in the factory. First an orientation study was performed to find an optimum process window and two potential underfill candidates. Samples were made with the optimum process setting. To verify the process feasibility, thermal shock testing, moisture sensitivity assessment and high temperature storage testing were carried out. The reliability test results showed that one type of underfill performed very well, while another one could not meet the reliability requirements. The root failure cause with the troublesome underfill was found not to be caused by the assembly process but to be related to the underfill material and the via construction in the substrate.
无铅倒装芯片组装工艺研究
为了满足当前射频功率放大器模块日益增长的成本和尺寸要求,开发了将无源元件集成到单个芯片上的技术。在层压板上使用无铅焊料凸起进行倒装芯片组装,用于模块级组装。本文对装配过程进行了详细的研究。这包括,除其他外,焊膏印刷,倒装芯片的安置和下填充应用。这种倒装芯片组装的挑战是一级和二级互连的无铅处理,以及从预开发到工厂大规模生产所需的短生产时间。首先进行定向研究,以找到最佳工艺窗口和两个潜在的下填候选体。在最佳工艺条件下制备样品。为了验证工艺的可行性,进行了热冲击试验、水分敏感性评价和高温贮藏试验。可靠性试验结果表明,一种下填体性能良好,而另一种下填体不能满足可靠性要求。发现底填体问题的根本破坏原因不是由装配过程引起的,而是与底填体材料和衬底的通孔施工有关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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