Fault diagnosis technique for subranging ADCs

Abstract

This paper describes a fault diagnosis technique for subranging analog to digital converters (ADCs). Functional fault in each of the analog component in the subranging ADC affects the transfer function differently. This property is employed for fault diagnosis. Deviation from ideal of the transfer function which is categorized into offset error, gain error, DNL, and INL data, are used for fault diagnosis. The technique is therefore not dependent on the test method, and it can be applied to dynamic test data. The diagnosis procedure is presented in detail. Simulation results and a case study are also presented. They verify the diagnosis technique.<>