Life Prediction and Verification of Energy Meter Based on Multi-stress Influence Weibull Distribution Model

2020 21st International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2020-08-01 DOI:10.1109/ICEPT50128.2020.9202443

Jiangming Zhang, L. Yao, Jifan Lv, L. Ni, Jian Yuan, Yingjun Hu

{"title":"Life Prediction and Verification of Energy Meter Based on Multi-stress Influence Weibull Distribution Model","authors":"Jiangming Zhang, L. Yao, Jifan Lv, L. Ni, Jian Yuan, Yingjun Hu","doi":"10.1109/ICEPT50128.2020.9202443","DOIUrl":null,"url":null,"abstract":"Generally, the failure distribution characteristics of different failure modes are different, and the stress types and degradation processes that induce their failures also differ. This paper proposes a method for predicting the life of electric energy meter based on Multi-stress influence Weibull distribution model. The stress types mainly include environmental stress and electrical stress. Using historical fault data of electric energy meter to establish Weibull distribution model of failure rate of each failure mode, and then for the main types of influence stress, establish a model between the influence stress and failure rate of each failure mode, and calculate the influence coefficient. The short-term life of the overall energy meter is obtained by adjusting the failure rate at the predicted stage of each failure mode. By verifying the field actual energy meter fault data, showing that the method can effectively predict the life of the energy meter, and provide technical support for energy meter status replacement, and fault early warning.","PeriodicalId":136777,"journal":{"name":"2020 21st International Conference on Electronic Packaging Technology (ICEPT)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 21st International Conference on Electronic Packaging Technology (ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT50128.2020.9202443","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

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Abstract

Generally, the failure distribution characteristics of different failure modes are different, and the stress types and degradation processes that induce their failures also differ. This paper proposes a method for predicting the life of electric energy meter based on Multi-stress influence Weibull distribution model. The stress types mainly include environmental stress and electrical stress. Using historical fault data of electric energy meter to establish Weibull distribution model of failure rate of each failure mode, and then for the main types of influence stress, establish a model between the influence stress and failure rate of each failure mode, and calculate the influence coefficient. The short-term life of the overall energy meter is obtained by adjusting the failure rate at the predicted stage of each failure mode. By verifying the field actual energy meter fault data, showing that the method can effectively predict the life of the energy meter, and provide technical support for energy meter status replacement, and fault early warning.

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基于多应力影响威布尔分布模型的电能表寿命预测与验证

通常，不同破坏模式的破坏分布特征不同，导致其破坏的应力类型和退化过程也不同。提出了一种基于多应力影响威布尔分布模型的电能表寿命预测方法。应力类型主要包括环境应力和电应力。利用电能表历史故障数据，建立各失效模式故障率的威布尔分布模型，然后针对主要影响应力类型，建立各失效模式影响应力与故障率之间的模型，计算影响系数。通过调整各失效模式预测阶段的故障率，获得整体电能表的短期寿命。通过对现场实际电能表故障数据的验证，表明该方法能够有效地预测电能表的寿命，为电能表状态更换、故障预警提供技术支持。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2020 21st International Conference on Electronic Packaging Technology (ICEPT)

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