Extending tester capability by use of programmable-gain instrumentation amplifier as an IC test solution

Abstract

Often times IC test solutions are constrained by the capability of the choice or targeted tester technology in terms of parametric or functional test specifications. This choice or targeted tester technology is usually the main or majority tester platform that is being used in a given organization. This paper will focus on a methodology to extend the capability of a said tester for a higher precision parametric measurement. It will not cover enhancement for functional test capability. In this paper, the use of circuit designs and programming solutions is detailed to create a novel test solution, by way of creative use of programmable-gain instrumentation amplifier in test board design, allowing IC test solution to extend beyond the specification of a targeted tester technology, ie extending the higher precision measurement capability onto the test board. This paper will also touch on the bonus financial benefit of such a test solution, in which cost savings can be achieved via targeted test board design changes together with its complementing programming solutions for use on existing tester solution instead of asset capitalization of new tester technology to enable the same IC test requirements.