650V SOI LIGBT for Switch-Mode Power Supply Application

T. Letavic, J. Petruzzello, J. Claes, P. Eggenkamp, E. Janssen, A. B. van der Wal
{"title":"650V SOI LIGBT for Switch-Mode Power Supply Application","authors":"T. Letavic, J. Petruzzello, J. Claes, P. Eggenkamp, E. Janssen, A. B. van der Wal","doi":"10.1109/ISPSD.2006.1666145","DOIUrl":null,"url":null,"abstract":"This paper presents a thin-layer high voltage silicon-on-insulator conductivity modulated device which has been optimized for use within integrated switch mode power supply applications. The device contains a linearly-graded charge profile in the drift region, and the fast-switching LIGBT can be used at current densities which are at least a factor-of-two greater than the SOI LDMOS of equivalent breakdown voltage (LIGBT BVds 650V/Rsp 4 ohm mm2). A device failure mechanism which occurs during shorted-winding SMPS transients unique to thin-layer devices has been documented, and device protection circuitry has been developed to provide a transient current limit mechanism within the high voltage device. The electrical characteristics of the protected conductivity modulated thin-layer SOI high voltage device are comparable to state-of-the-art discrete components, and as such this process technology provides a monolithic alternative for miniaturization and integration of switch mode power supply topologies","PeriodicalId":198443,"journal":{"name":"2006 IEEE International Symposium on Power Semiconductor Devices and IC's","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"39","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE International Symposium on Power Semiconductor Devices and IC's","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2006.1666145","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 39

Abstract

This paper presents a thin-layer high voltage silicon-on-insulator conductivity modulated device which has been optimized for use within integrated switch mode power supply applications. The device contains a linearly-graded charge profile in the drift region, and the fast-switching LIGBT can be used at current densities which are at least a factor-of-two greater than the SOI LDMOS of equivalent breakdown voltage (LIGBT BVds 650V/Rsp 4 ohm mm2). A device failure mechanism which occurs during shorted-winding SMPS transients unique to thin-layer devices has been documented, and device protection circuitry has been developed to provide a transient current limit mechanism within the high voltage device. The electrical characteristics of the protected conductivity modulated thin-layer SOI high voltage device are comparable to state-of-the-art discrete components, and as such this process technology provides a monolithic alternative for miniaturization and integration of switch mode power supply topologies
用于开关电源的650V SOI灯
本文提出了一种薄层高压绝缘体上硅电导率调制器件,该器件已经过优化,可用于集成开关模式电源应用。该器件在漂移区包含线性梯度电荷分布,并且快速开关light可以在电流密度至少比等效击穿电压(light BVds 650V/Rsp 4欧姆mm2)的SOI LDMOS大两倍的电流密度下使用。在薄层器件特有的短绕组SMPS瞬态中发生的器件失效机制已经被记录,并且器件保护电路已经开发出来,以在高压器件内提供瞬态电流限制机制。受保护的电导率调制薄层SOI高压器件的电气特性可与最先进的分立元件相媲美,因此该工艺技术为开关模式电源拓扑的小型化和集成提供了一种单片替代方案
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