Single Event Effects Testing on the SERDES, Fabric Flip-Flops and PLL in a Radiation-Hardened Flash-Based FPGA-RT4G150

Abstract

Heavy-ion beam is used to perform Single Event Effects testing on the Flash-based and radiation hardened FPGA, the RT4G150 device. Soft errors due to SEU and SET in the fabric Flip-Flops and PLL generated clocks are measured and analyzed. SEFIs in PLL and SERDES are also observed.