{"title":"Scan chain securization though Open-Circuit Deadlocks","authors":"M. Portolan, B. G. V. Treuren, Suresh Goyal","doi":"10.1109/TEST.2010.5699300","DOIUrl":null,"url":null,"abstract":"This paper presents the Open-Circuit Deadlock (OCD), a primitive that allows flexible and scalable securization of a JTAG target, from the cell to the system level.","PeriodicalId":265156,"journal":{"name":"2010 IEEE International Test Conference","volume":"154 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2010.5699300","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents the Open-Circuit Deadlock (OCD), a primitive that allows flexible and scalable securization of a JTAG target, from the cell to the system level.
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