Reflow profile simulation by finite element method for a BGA package

Shen Liang, Wang Mingxiang, He Yonghong, Lam Tim Fai, Jiang Qi
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引用次数: 27

Abstract

During reflow process, solder ball temperature profile is a concern, but it is difficult to direct measure the temperature. In this study, a forced convective airflow reflow furnace was analyzed. Measured profiles from two typical BGA packages were simulated successfully. Temperature profile of package surface has been compared with that of solder balls. Temperature distribution among solder ball array has been observed and analyzed. It has been found that impinging jet airflow model provides appropriate convective heat transfer coefficient that can be applied to profile simulation successfully. Dominant heat transfer mechanism is vertical thermal conduction from package top surface to solder ball, while other heat transfer mechanism also have notable effects on solder ball temperature. Solder ball array layout has a significant effect on temperature uniformity of solder balls. A uniform distribution can be obtained when all the balls are located under chip area.
BGA封装回流流曲线有限元模拟
在回流焊过程中,焊锡球温度分布是一个值得关注的问题,但直接测量焊锡球温度是比较困难的。本文对强制对流气流回流炉进行了分析。成功地模拟了两种典型BGA封装的实测轮廓。对封装表面温度分布与焊料球表面温度分布进行了比较。观察和分析了焊锡球阵列的温度分布。研究发现,碰撞射流模型提供了合适的对流换热系数,可以成功地应用于剖面模拟。从封装顶表面到焊球的垂直传热机制是主要的传热机制,其他传热机制对焊球温度也有显著影响。焊球排列对焊球温度均匀性有显著影响。当所有球均位于切屑区下方时,可获得均匀分布。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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