Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake, Takaaki Kato, S. Kajihara, Y. Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi, K. Hatayama
{"title":"Innovative Test Practices in Asia","authors":"Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake, Takaaki Kato, S. Kajihara, Y. Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi, K. Hatayama","doi":"10.1109/VTS48691.2020.9107640","DOIUrl":null,"url":null,"abstract":"The IP session highlights three innovative test practices in Asia, which include a testing solution for the millimeterwave (76- to 81- GHz) without expensive instruments, an on-chip delay measurement method for in-field test and a power control method of at-speed scan test for IR violation reduction. These would be useful for automotive and IoT application device testing.","PeriodicalId":326132,"journal":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 38th VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS48691.2020.9107640","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The IP session highlights three innovative test practices in Asia, which include a testing solution for the millimeterwave (76- to 81- GHz) without expensive instruments, an on-chip delay measurement method for in-field test and a power control method of at-speed scan test for IR violation reduction. These would be useful for automotive and IoT application device testing.
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