Test cost/coverage tradeoffs in complex telecommunication circuits

Abstract

Cost and quality are crucial at any project development. These parameters are strongly interrelated and must be taken into account from the startting phases, of the development. However, in general, classical test tools we not flexible with these aspects. It is, they do not allow the designer to reduce test costs at the expense of a minimum loss in fault coverage. In this paper, the experience of Telefonica I+D concerning the mariagexnent of twt cost and quality factors will be praerrted. Emphasis will be applied to show the main problems that have appeared to generate the test of two high complexity telecommunication ASICS.