Soft Core Embedded Processor Based Built-In Self-Test of FPGAs

Bradley F. Dutton, C. Stroud
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引用次数: 9

Abstract

This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the FPGA resources under test, control of BIST execution, retrieval of BIST results, and fault diagnosis. The approach was implemented in Xilinx Virtex-5 FPGAs but is applicable to any FPGA that contains an internal configuration memory access port.
基于fpga内置自检的软核嵌入式处理器
本文首次采用软核嵌入式处理器实现现场可编程门阵列(FPGA)的内置自检(BIST),用于重新配置被测FPGA资源、控制BIST执行、检索BIST结果和故障诊断。该方法在Xilinx Virtex-5 FPGA中实现,但适用于任何包含内部配置存储器访问端口的FPGA。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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