{"title":"Soft Core Embedded Processor Based Built-In Self-Test of FPGAs","authors":"Bradley F. Dutton, C. Stroud","doi":"10.1109/SSST.2010.5442812","DOIUrl":null,"url":null,"abstract":"This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the FPGA resources under test, control of BIST execution, retrieval of BIST results, and fault diagnosis. The approach was implemented in Xilinx Virtex-5 FPGAs but is applicable to any FPGA that contains an internal configuration memory access port.","PeriodicalId":405651,"journal":{"name":"2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SSST.2010.5442812","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the FPGA resources under test, control of BIST execution, retrieval of BIST results, and fault diagnosis. The approach was implemented in Xilinx Virtex-5 FPGAs but is applicable to any FPGA that contains an internal configuration memory access port.