M. Masunaga, T. Hashimoto, Kouichi Kato, H. Andou, Hideo Numabe, Zen Tomizawa, N. Matsuura
{"title":"A low noise and low loss power MOSFET with low Vth regions for voltage regulators","authors":"M. Masunaga, T. Hashimoto, Kouichi Kato, H. Andou, Hideo Numabe, Zen Tomizawa, N. Matsuura","doi":"10.1109/ISPSD.2013.6694404","DOIUrl":null,"url":null,"abstract":"A novel low voltage power MOSFET with a low threshold voltage (Vth) region (sub-MOS) is proposed. The proposed MOSFET has a superior trade-off relationship between output efficiency and switching noise, with a spike voltage 82% lower than a conventional MOSFET and the same efficiency at 300 kHz with an output current of 20 A. Since the proposed device reduces the drain current through rate (dir/dt) by false turn-on of the sub-MOS, it decreases the spike voltage during diode reverse recovery. The false turn-on losses are suppressed by the saturation current of the sub-MOS, which is controlled by optimizing the sub-MOS area and the Vth. The low on-state resistance of sub-MOS compensates for the false turn-on losses to achieve high efficiency.","PeriodicalId":175520,"journal":{"name":"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2013.6694404","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A novel low voltage power MOSFET with a low threshold voltage (Vth) region (sub-MOS) is proposed. The proposed MOSFET has a superior trade-off relationship between output efficiency and switching noise, with a spike voltage 82% lower than a conventional MOSFET and the same efficiency at 300 kHz with an output current of 20 A. Since the proposed device reduces the drain current through rate (dir/dt) by false turn-on of the sub-MOS, it decreases the spike voltage during diode reverse recovery. The false turn-on losses are suppressed by the saturation current of the sub-MOS, which is controlled by optimizing the sub-MOS area and the Vth. The low on-state resistance of sub-MOS compensates for the false turn-on losses to achieve high efficiency.