Modeling of solder joint failure due to PCB bending during drop impact

Gu Jie, C. T. Lim, A. Tay
{"title":"Modeling of solder joint failure due to PCB bending during drop impact","authors":"Gu Jie, C. T. Lim, A. Tay","doi":"10.1109/EPTC.2004.1396694","DOIUrl":null,"url":null,"abstract":"Reliability of IC packages during drop impact is critical for portable electronic products. These packages are susceptible to solder joint failure when induced by mechanical shock and printed circuit board (PCB) bending during impact. Normally, portable products are designed to withstand a few accidental drops without resulting in major mechanical failure. In this study, we use the ABAQUS/EXPLICIT finite element software to perform the dynamic drop impact simulation. We will use the equivalent layer model for the array of solder columns to simplify the modeling problem. From the analysis, we are able to examine the effects of PCB bending arising from the different number of screws used and the effect of chip location. It is found that PCB bending curvature determines the stress states induced in the solder columns of the IC packages mounted at different locations in the PCB. In addition, the PCB bending curvature can also be used to predict the critical locations where the solder columns will fail first","PeriodicalId":370907,"journal":{"name":"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2004.1396694","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17

Abstract

Reliability of IC packages during drop impact is critical for portable electronic products. These packages are susceptible to solder joint failure when induced by mechanical shock and printed circuit board (PCB) bending during impact. Normally, portable products are designed to withstand a few accidental drops without resulting in major mechanical failure. In this study, we use the ABAQUS/EXPLICIT finite element software to perform the dynamic drop impact simulation. We will use the equivalent layer model for the array of solder columns to simplify the modeling problem. From the analysis, we are able to examine the effects of PCB bending arising from the different number of screws used and the effect of chip location. It is found that PCB bending curvature determines the stress states induced in the solder columns of the IC packages mounted at different locations in the PCB. In addition, the PCB bending curvature can also be used to predict the critical locations where the solder columns will fail first
跌落冲击时PCB弯曲导致焊点失效的建模
对于便携式电子产品来说,IC封装在跌落冲击下的可靠性至关重要。当受到机械冲击和印刷电路板(PCB)在冲击过程中的弯曲时,这些封装很容易导致焊点失效。通常,便携式产品的设计能够承受几次意外跌落而不会导致重大机械故障。在本研究中,我们使用ABAQUS/EXPLICIT有限元软件进行动态跌落冲击仿真。我们将对焊柱阵列使用等效层模型来简化建模问题。从分析中,我们能够检查由于使用的螺钉数量不同和芯片位置的影响而引起的PCB弯曲的影响。发现PCB弯曲曲率决定了安装在PCB中不同位置的IC封装焊料柱的应力状态。此外,PCB弯曲曲率也可以用来预测焊接柱首先失效的关键位置
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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