Single Event Testing of SDRAM, DDR2 and DDR3 Memories

2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2016-07-11 DOI:10.1109/NSREC.2016.7891742

S. Guertin, Mehran Amrbar

引用次数: 8

Abstract

SEE test results are presented for SDRAM, DDR2, and DDR3. No tested devices exhibited SEL. SBUs were observed, but no MBUs were observed in data words. SEFI data were taken at low and high speed.

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SDRAM, DDR2和DDR3存储器的单事件测试

给出了SDRAM、DDR2和DDR3的SEE测试结果。没有测试设备显示SEL。观察到SBUs，但数据字未观察到MBUs。在低速和高速下采集SEFI数据。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2016 IEEE Radiation Effects Data Workshop (REDW)

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