Reduce your cycle time by utilizing automation for wafer test data collection

Abstract

Many strategies are generally applied in the semiconductor industry to reduce cycle times. This technical paper describes an integrated automation environment that has been implemented on the various tester platforms at Kilby Center (KFAB) of Texas Instruments (TI). In addition to reducing wafer test cycle time, the tester automation eliminates human errors, which is an added benefit over vendor "job tools". The referenced automation environment integrates seamlessly with the manufacturing execution system (MES), and facilitates data collection in both file format and in an electrical test database. The automation flow typically includes the tasks of tester initialization, system processes' validation, tester hardware mini-diagnostics, probe card verification, test program load and execution, data upload to MES and test database, validation of collected test data, execution of lot disposition, and lot movement/hold in MES. However, there are differences across multiple tester platforms provided by different equipment vendors. In addition to detailing the automation components of tester platforms, the paper highlights the cycle time impacts.