Hwang How Yuan, N. Jaafar, Sorono Dexter Velez, Lee Jong Bum, Y. Y. Wei, Daniel Rhee Min Woo
{"title":"Development of SiC power module using 70μm single metal layer substrates","authors":"Hwang How Yuan, N. Jaafar, Sorono Dexter Velez, Lee Jong Bum, Y. Y. Wei, Daniel Rhee Min Woo","doi":"10.1109/EPTC.2015.7412299","DOIUrl":null,"url":null,"abstract":"While leadframe has come a long way as a cost effective substrate, there is still limitation over its design rule. In this article, the authors have developed and put to test a SiC based PQFN using 70μm single metal layer substrates, allowing further miniaturization and complex design of PQFN. New high temperature EMC with a Tg of 241°C and lead free bismuth silver solder are adopted. Reliability tests and RDS,on results showed that the materials adopted in the development does not degrade the MOSFET's functionality and all samples passed reliability and power cycling tests.","PeriodicalId":418705,"journal":{"name":"2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC)","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2015.7412299","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
While leadframe has come a long way as a cost effective substrate, there is still limitation over its design rule. In this article, the authors have developed and put to test a SiC based PQFN using 70μm single metal layer substrates, allowing further miniaturization and complex design of PQFN. New high temperature EMC with a Tg of 241°C and lead free bismuth silver solder are adopted. Reliability tests and RDS,on results showed that the materials adopted in the development does not degrade the MOSFET's functionality and all samples passed reliability and power cycling tests.