Development of SiC power module using 70μm single metal layer substrates

Hwang How Yuan, N. Jaafar, Sorono Dexter Velez, Lee Jong Bum, Y. Y. Wei, Daniel Rhee Min Woo
{"title":"Development of SiC power module using 70μm single metal layer substrates","authors":"Hwang How Yuan, N. Jaafar, Sorono Dexter Velez, Lee Jong Bum, Y. Y. Wei, Daniel Rhee Min Woo","doi":"10.1109/EPTC.2015.7412299","DOIUrl":null,"url":null,"abstract":"While leadframe has come a long way as a cost effective substrate, there is still limitation over its design rule. In this article, the authors have developed and put to test a SiC based PQFN using 70μm single metal layer substrates, allowing further miniaturization and complex design of PQFN. New high temperature EMC with a Tg of 241°C and lead free bismuth silver solder are adopted. Reliability tests and RDS,on results showed that the materials adopted in the development does not degrade the MOSFET's functionality and all samples passed reliability and power cycling tests.","PeriodicalId":418705,"journal":{"name":"2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC)","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2015.7412299","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

While leadframe has come a long way as a cost effective substrate, there is still limitation over its design rule. In this article, the authors have developed and put to test a SiC based PQFN using 70μm single metal layer substrates, allowing further miniaturization and complex design of PQFN. New high temperature EMC with a Tg of 241°C and lead free bismuth silver solder are adopted. Reliability tests and RDS,on results showed that the materials adopted in the development does not degrade the MOSFET's functionality and all samples passed reliability and power cycling tests.
70μm单金属层基板SiC功率模块的研制
虽然引线框架作为一种具有成本效益的基板已经走了很长一段路,但其设计规则仍然存在局限性。在本文中,作者开发并测试了使用70μm单金属层衬底的SiC基PQFN,从而实现了PQFN的进一步小型化和复杂设计。采用Tg为241℃的新型高温电磁兼容和无铅铋银焊料。可靠性测试和RDS测试结果表明,开发中采用的材料不会降低MOSFET的功能,并且所有样品都通过了可靠性和功率循环测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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