System-level thermal design and testing of a 3G wireless network gateway

I. Obinelo
{"title":"System-level thermal design and testing of a 3G wireless network gateway","authors":"I. Obinelo","doi":"10.1109/STHERM.2006.1625200","DOIUrl":null,"url":null,"abstract":"A major OEM of dedicated gateways for mobile networks was faced with a show-stopping problem: their flagship product was failing during initial field tests due to overheating, so what to do to salvage their multi-million dollar investment and thousands of hours of development effort? The design of an improved thermal architecture for the product is the subject of this paper","PeriodicalId":222515,"journal":{"name":"Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.2006.1625200","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

A major OEM of dedicated gateways for mobile networks was faced with a show-stopping problem: their flagship product was failing during initial field tests due to overheating, so what to do to salvage their multi-million dollar investment and thousands of hours of development effort? The design of an improved thermal architecture for the product is the subject of this paper
一个3G无线网络网关的系统级热设计与测试
一家主要的移动网络专用网关OEM面临着一个令人难以接受的问题:他们的旗舰产品在最初的现场测试中由于过热而失败,那么该如何挽救他们数百万美元的投资和数千小时的开发努力呢?设计一种改进的产品热结构是本文的主题
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