Double gate dynamic threshold voltage (DGDT) SOI MOSFETs for low power high performance designs

Liqiong Wei, Zhanping Chen, K. Roy
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引用次数: 42

Abstract

In this paper, double gate dynamic threshold voltage (DGDT) SOI MOSFETs, which combine the advantages of DTMOS and FD SOI MOSFETs without the limitation of the supply voltage, are simulated using SOI-SPICE4.4. The threshold voltages, leakage currents and drive currents for FD SOI MOSFETs and DGDT SOI MOSFETs are compared. DGDT SOI MOSFETs show symmetric characteristics and the best I/sub on/I(off)/. Excellent DC inverter characteristics down to 0.15 V and good full adder performance at 1V are shown. The propagation delay and the average power consumption of the full adder are 0.625 ns and 11.5 /spl mu/W, respectively. It can be seen that DGDT SOI MOSFET is a good candidate for low power high performance designs.
双栅动态阈值电压(DGDT) SOI mosfet低功耗高性能设计
本文利用SOI- spice4.4对双栅动态阈值电压(DGDT) SOI mosfet进行了仿真,该器件结合了DTMOS和FD SOI mosfet的优点,不受电源电压的限制。比较了FD SOI mosfet和DGDT SOI mosfet的阈值电压、漏电流和驱动电流。DGDT SOI mosfet具有对称特性和最佳的I/sub on/I(off)/。优异的直流逆变器特性低至0.15 V和良好的全加法器性能在1V。全加法器的传输延迟和平均功耗分别为0.625 ns和11.5 /spl mu/W。可以看出,DGDT SOI MOSFET是低功率高性能设计的良好候选者。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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