{"title":"Low-Power Weighted Pseudo-Random Test Pattern Generation for Launch-on-Capture Delay Testing*","authors":"D. Xiang, J. Cai, Bo Liu","doi":"10.1109/VTS48691.2020.9107597","DOIUrl":null,"url":null,"abstract":"A new weighted pseudo-random test generator called wPRPG is proposed for low-power launch-on-capture (LOC) transition delay fault testing. The low-power weighted PRPG is implemented by assigning different weights on the test enable signals and applying a gating technique. The new low-power PRPG can achieve much higher transition delay fault coverage in LOC delay testing than the conventional test-per-scan PRPG.","PeriodicalId":326132,"journal":{"name":"2020 IEEE 38th VLSI Test Symposium (VTS)","volume":"66 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 38th VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS48691.2020.9107597","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A new weighted pseudo-random test generator called wPRPG is proposed for low-power launch-on-capture (LOC) transition delay fault testing. The low-power weighted PRPG is implemented by assigning different weights on the test enable signals and applying a gating technique. The new low-power PRPG can achieve much higher transition delay fault coverage in LOC delay testing than the conventional test-per-scan PRPG.