{"title":"High fan-in circuit design","authors":"L. Clark, G. Taylor","doi":"10.1109/BIPOL.1994.587847","DOIUrl":null,"url":null,"abstract":"A review of high fan-in circuit design in contemporary logic technologies is presented. This is followed by a description of a BiNMOS circuit structure which allows the construction of large fan-in, dynamic logical NAND or OR functions. Power and reliability considerations such as BJT reverse V/sub be/ and MOS hot electron protection are included. Application of the circuit in the 3.3 V, 100 MHz, implementation of the Pentium Microprocessor on a 0.6 mm BiNMOS process is discussed.","PeriodicalId":373721,"journal":{"name":"Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BIPOL.1994.587847","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20
Abstract
A review of high fan-in circuit design in contemporary logic technologies is presented. This is followed by a description of a BiNMOS circuit structure which allows the construction of large fan-in, dynamic logical NAND or OR functions. Power and reliability considerations such as BJT reverse V/sub be/ and MOS hot electron protection are included. Application of the circuit in the 3.3 V, 100 MHz, implementation of the Pentium Microprocessor on a 0.6 mm BiNMOS process is discussed.