Reliability Challenges in Analog and Mixed Signal Technologies

Abstract

Unique analog product application requirements such as high speed, low noise, low power, high precision and high voltage demand complex analog process technologies. This complexity poses several reliability challenges that are specific to each technology. In this paper some of the key reliability mechanisms in most common analog process technologies are highlighted. To meet broad range of analog IC reliability requirements, in-depth device reliability characterization is essential besides the traditional process reliability qualification.