The reliability of short length GaAs bulk resistors

2000 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.00TH8513) Pub Date : 2000-11-05 DOI:10.1109/GAASRW.2000.902422

E. Sabin, J. Scarpulla, Y. Chou

引用次数: 0

Abstract

The reliability of short length bulk resistors is evaluated for design current density stressing and for highly accelerated stressing. The failure modes for these different stress conditions are compared and a mechanism is proposed to explain these failure modes.

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短长度GaAs体电阻的可靠性

在设计电流密度应力和高加速应力条件下，对短长度体电阻的可靠性进行了评价。比较了这些不同应力条件下的破坏模式，并提出了一种解释这些破坏模式的机制。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2000 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.00TH8513)

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