Measurement and Analysis of System-level ESD-induced Soft Failures of a Sense Amplifier Flip-Flop with Pseudo Differential Inputs

Abstract

A sense amplifier flip-flop, which is commonly used as an input receiver in a DRAM, is designed in the simplified motherboard and DIMM structures of a laptop PC. System-level ESD-induced soft failures of the sense amplifier flip-flop are measured and validated with SPICE simulation.