Open architecture test system: the new frontier

Abstract

The recent test challenges have resulted ina general consensus that the test industry needs a fundamental change. The increasing complexity of the present day System-on-a-Chip (SOC) devices and simultaneous demand in the test cost reduction has forced both IC manufactures (ATE End Users) and tester vendors (ATE Suppliers) to re-think how IC testing should be done. According to the 2001 ITRS roadmap, without re-engineering, the projected tester cost will continue to increase in the near future; such increasing cost alone requires a fundamental change. A common, open architecture test system platform has been envisioned to address this challenge. The open architecture allows third parties to develop test solutions in the most efficient environment and promotes the reusability of hardware and software modules. Thus, it reduces the development time (time to market) and the overall testing cost. This paper discusses the basic concept of the Semiconductor Test Consortium open architecture (OPEN STAR/sup TM/) together with the benefits to the industry and the program to implement this industry wide effort.