Low temperature Au-Au direct bonding with highly <111>-oriented Au films

Wei-You Hsu, John A. Wu, Chih Chen
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Abstract

In this study, a bonding process with highly <111> oriented nano-twined Au (nt-Au) was proposed. A less void bonding interface was observed and it reveals a good bonding quality for the bonded samples. In addition, the Au grains can grow across original interface. All of the above make we suggest Au-Au direct bonding have high strength and durable bonding structure.
高取向Au薄膜的低温Au-Au直接键合
本研究提出了一种高取向纳米缠绕金(nt-Au)的键合工艺。结果表明,结合试样的结合质量较好,结合界面空洞较小。此外,金晶粒可以跨越原界面生长。所有这些都使我们建议Au-Au直接键合具有高强度和持久的键合结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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