1/ƒ noise in ZnO films

Abstract

We have investigated the low-frequency noise of ZnO film deposited by dc sputtering technique on glass substrate. We characterized the noise below 100kHz and obtained classical 1/ƒ spectra. We attempted to verify the validity of Hooge's empirical relation and to test its usefulness as a diagnostic tool. The 1/ƒ noise normalized for bias, frequency and unit area, Cus is proportional with the sheet resistance Rsh. We found that the noise results depend strongly on illumination.