Double-pulse-single-event transients in combinational logic

Abstract

For the first time, double-pulse-single-event transients (DPSETs) are observed during heavy-ion broad beam testing. The transients are generated in a serially connected string of inverters and measured with an autonomous on-chip SET pulse-width measurement circuit. Three-dimensional mixed-mode technology computer aided design (TCAD) simulations show that DPSETs are the result of multiple inverters being upset by a single ion strike.