Automatic Detection of Via Arrays in AFM Images for CMP Dishing Evaluation

A. Zienert, Jan Langer, Doreen Hensel, L. Hofmann, K. Gottfried, J. Schuster
{"title":"Automatic Detection of Via Arrays in AFM Images for CMP Dishing Evaluation","authors":"A. Zienert, Jan Langer, Doreen Hensel, L. Hofmann, K. Gottfried, J. Schuster","doi":"10.1109/IITC/MAM57687.2023.10154637","DOIUrl":null,"url":null,"abstract":"We present an efficient algorithm for the detection of array-like patterns of circular vias in AFM images. It combines a new variant of the Hough transformation with an efficient implementation of brute-force search to ensure good results and high performance, compared to a simple intuitive approach. A set of manually labeled benchmark data is used to systematically evaluate the accuracy and improve the algorithm. We apply the new via detection method to measure dishing in AFM images of copper vias after CMP.","PeriodicalId":241835,"journal":{"name":"2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM)","volume":"114 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IITC/MAM57687.2023.10154637","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

We present an efficient algorithm for the detection of array-like patterns of circular vias in AFM images. It combines a new variant of the Hough transformation with an efficient implementation of brute-force search to ensure good results and high performance, compared to a simple intuitive approach. A set of manually labeled benchmark data is used to systematically evaluate the accuracy and improve the algorithm. We apply the new via detection method to measure dishing in AFM images of copper vias after CMP.
用于CMP碟形评价的AFM图像中通孔阵列的自动检测
我们提出了一种有效的算法来检测AFM图像中圆形过孔的阵列状图案。与简单的直观方法相比,它结合了Hough变换的新变体和暴力搜索的有效实现,以确保良好的结果和高性能。使用一组人工标记的基准数据来系统地评估准确性并改进算法。我们将新的孔检测方法应用于CMP后铜孔的AFM图像的碟形测量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信