Special Session: Survey of Test Point Insertion for Logic Built-in Self-test

Abstract

This article surveys test point (TP) architectures and test point insertion (TPI) methods for increasing pseudo-random and logic built-in self-test (LBIST) fault coverage. We present a history of TPI approaches, including TPI for increasing stuck-at fault coverage, compressing test patterns, detecting path delay faults, and reducing test power. We discuss some known weaknesses of TPs and explore research directions to overcome them.