Gold stud bump in flip-chip applications

J. Jordan
{"title":"Gold stud bump in flip-chip applications","authors":"J. Jordan","doi":"10.1109/IEMT.2002.1032735","DOIUrl":null,"url":null,"abstract":"As power requirements and operating frequencies increase, more and more designs will look toward ball bumps as an interconnect solution. While solder has traditionally been the incumbent material for these bumps, solder's limitations have become manufacturing and performance limitations. As a result, packaging designers are looking toward gold bumps as a strong contender in the first-level interconnect battle. This paper briefly discusses the limitations of the solder connection process and compares that to the gold bump process. Furthermore, it describes the four leading alternatives for achieving gold bump flip-chip connections.","PeriodicalId":340284,"journal":{"name":"27th Annual IEEE/SEMI International Electronics Manufacturing Technology Symposium","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"33","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"27th Annual IEEE/SEMI International Electronics Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2002.1032735","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 33

Abstract

As power requirements and operating frequencies increase, more and more designs will look toward ball bumps as an interconnect solution. While solder has traditionally been the incumbent material for these bumps, solder's limitations have become manufacturing and performance limitations. As a result, packaging designers are looking toward gold bumps as a strong contender in the first-level interconnect battle. This paper briefly discusses the limitations of the solder connection process and compares that to the gold bump process. Furthermore, it describes the four leading alternatives for achieving gold bump flip-chip connections.
倒装芯片应用中的金螺柱凸点
随着功率要求和工作频率的增加,越来越多的设计将把球碰撞作为互连解决方案。虽然焊料传统上是这些凸起的主要材料,但焊料的局限性已经成为制造和性能限制。因此,包装设计师们正在寻找黄金疙瘩作为一个强有力的竞争者在一级互连的战斗。本文简要讨论了焊料连接工艺的局限性,并将其与金凹凸工艺进行了比较。此外,它还描述了实现金凸点倒装芯片连接的四种主要替代方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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