K. Seyama, H. Yamamoto, K. Satou, H. Yoshimura, H. Ota, Y. Usui
{"title":"Transcription solder bump technology using the evaporation method","authors":"K. Seyama, H. Yamamoto, K. Satou, H. Yoshimura, H. Ota, Y. Usui","doi":"10.1109/ICMCM.1998.670800","DOIUrl":null,"url":null,"abstract":"We have developed a new transcription solder bump (TSB) technology using the evaporation method. We use this method in the current production of micro solder area array bump (/spl mu/SAB) formation with 153 /spl mu/m pitch and on chips with over 8000 bumps. In this method, transcription bumps are formed on a dummy wafer by evaporation using a metal mask. Temporary chips are made by dicing the dummy wafer with evaporated bumps, and then the bumps on the temporary chips are transcribed to real chips. This technology has a high accuracy in terms of bump height of less than 2 /spl mu/m, and bumping yield is greater than 99.99999% per bump. Also, we have developed a restoration technique for solder bumps with high yield and low cost.","PeriodicalId":315799,"journal":{"name":"Proceedings. 1998 International Conference on Multichip Modules and High Density Packaging (Cat. No.98EX154)","volume":"97 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 1998 International Conference on Multichip Modules and High Density Packaging (Cat. No.98EX154)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMCM.1998.670800","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
We have developed a new transcription solder bump (TSB) technology using the evaporation method. We use this method in the current production of micro solder area array bump (/spl mu/SAB) formation with 153 /spl mu/m pitch and on chips with over 8000 bumps. In this method, transcription bumps are formed on a dummy wafer by evaporation using a metal mask. Temporary chips are made by dicing the dummy wafer with evaporated bumps, and then the bumps on the temporary chips are transcribed to real chips. This technology has a high accuracy in terms of bump height of less than 2 /spl mu/m, and bumping yield is greater than 99.99999% per bump. Also, we have developed a restoration technique for solder bumps with high yield and low cost.