High temperature Ti-Al-based ohmic contacts to p-6H-SiC

A. Andreev, M. Rastegaeva, A. Babanin, M. A. Yagovkina, S.V. Rendokova, N. Savkina
{"title":"High temperature Ti-Al-based ohmic contacts to p-6H-SiC","authors":"A. Andreev, M. Rastegaeva, A. Babanin, M. A. Yagovkina, S.V. Rendokova, N. Savkina","doi":"10.1109/SMICND.1998.732387","DOIUrl":null,"url":null,"abstract":"Low-resistance ohmic contacts (10/sup -4/ Ohm cm/sup 2/ at N/sub a/-N/sub d/=10/sup 19/ cm/sup -3/) based on Ti-Al composition were prepared to p-6H-SiC grown by various techniques. This contacts demonstrate exellent reproductivity and the ones can operate at the environment temperatures up to 550/spl deg/C and densities of direct current up to 10/sup 4/ A/cm/sup 2/. Structure and composition of contact coating were studied by AES and SIMS layer-by-layer technique and X-ray phase analysis. Advanced study of electrical characteristic of Ti-Al-based ohmic contacts was carried out.","PeriodicalId":406922,"journal":{"name":"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.1998.732387","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

Low-resistance ohmic contacts (10/sup -4/ Ohm cm/sup 2/ at N/sub a/-N/sub d/=10/sup 19/ cm/sup -3/) based on Ti-Al composition were prepared to p-6H-SiC grown by various techniques. This contacts demonstrate exellent reproductivity and the ones can operate at the environment temperatures up to 550/spl deg/C and densities of direct current up to 10/sup 4/ A/cm/sup 2/. Structure and composition of contact coating were studied by AES and SIMS layer-by-layer technique and X-ray phase analysis. Advanced study of electrical characteristic of Ti-Al-based ohmic contacts was carried out.
p-6H-SiC的高温ti - al基欧姆触点
采用多种工艺制备了基于Ti-Al成分的p-6H-SiC低阻触点(10/sup -4/欧姆cm/sup 2/在N/sub a/-N/sub d/=10/sup 19/ cm/sup -3/)。这种触点具有出色的再现性,并且可以在高达550/spl°C的环境温度和高达10/sup 4/ A/cm/sup 2/的直流密度下工作。采用AES、SIMS逐层技术和x射线相分析研究了接触涂层的结构和组成。对钛铝基欧姆触点的电特性进行了深入的研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信