A. Andreev, M. Rastegaeva, A. Babanin, M. A. Yagovkina, S.V. Rendokova, N. Savkina
{"title":"High temperature Ti-Al-based ohmic contacts to p-6H-SiC","authors":"A. Andreev, M. Rastegaeva, A. Babanin, M. A. Yagovkina, S.V. Rendokova, N. Savkina","doi":"10.1109/SMICND.1998.732387","DOIUrl":null,"url":null,"abstract":"Low-resistance ohmic contacts (10/sup -4/ Ohm cm/sup 2/ at N/sub a/-N/sub d/=10/sup 19/ cm/sup -3/) based on Ti-Al composition were prepared to p-6H-SiC grown by various techniques. This contacts demonstrate exellent reproductivity and the ones can operate at the environment temperatures up to 550/spl deg/C and densities of direct current up to 10/sup 4/ A/cm/sup 2/. Structure and composition of contact coating were studied by AES and SIMS layer-by-layer technique and X-ray phase analysis. Advanced study of electrical characteristic of Ti-Al-based ohmic contacts was carried out.","PeriodicalId":406922,"journal":{"name":"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.1998.732387","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Low-resistance ohmic contacts (10/sup -4/ Ohm cm/sup 2/ at N/sub a/-N/sub d/=10/sup 19/ cm/sup -3/) based on Ti-Al composition were prepared to p-6H-SiC grown by various techniques. This contacts demonstrate exellent reproductivity and the ones can operate at the environment temperatures up to 550/spl deg/C and densities of direct current up to 10/sup 4/ A/cm/sup 2/. Structure and composition of contact coating were studied by AES and SIMS layer-by-layer technique and X-ray phase analysis. Advanced study of electrical characteristic of Ti-Al-based ohmic contacts was carried out.