{"title":"A hybrid (logic+I/sub DDQ/) testing strategy using an iterative bridging fault filtering scheme","authors":"Tzuhao Chen, I. Hajj","doi":"10.1109/IDDQ.1997.633015","DOIUrl":null,"url":null,"abstract":"In this paper we propose a new hybrid (logic+I/sub DDQ/) testing strategy for efficient bridging fault (BF) detection. In our strategy, logic and I/sub DDQ/ testings are applied in sequence so that BFs that can be detected by the logic testing need not be targeted by the I/sub DDQ/ testing. The logic test generation is done via an iterative BF filtering in which fault coverage is maximized through test set augmentation. As a result only a small number of BFs need to be targeted by the I/sub DDQ/ test generator. Experiments show that this approach is capable of reaching very high BF coverage with a composite (logic+I/sub DDQ/) test set with very few I/sub DDQ/ vectors.","PeriodicalId":429650,"journal":{"name":"Digest of Papers IEEE International Workshop on IDDQ Testing","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers IEEE International Workshop on IDDQ Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IDDQ.1997.633015","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper we propose a new hybrid (logic+I/sub DDQ/) testing strategy for efficient bridging fault (BF) detection. In our strategy, logic and I/sub DDQ/ testings are applied in sequence so that BFs that can be detected by the logic testing need not be targeted by the I/sub DDQ/ testing. The logic test generation is done via an iterative BF filtering in which fault coverage is maximized through test set augmentation. As a result only a small number of BFs need to be targeted by the I/sub DDQ/ test generator. Experiments show that this approach is capable of reaching very high BF coverage with a composite (logic+I/sub DDQ/) test set with very few I/sub DDQ/ vectors.