L. Wu, A. Johnson, D. Kolosov, I. Parker, J. Trujillo
{"title":"Failure analysis of pixel shorting problems in polymer light emitting diode (PLED) displays","authors":"L. Wu, A. Johnson, D. Kolosov, I. Parker, J. Trujillo","doi":"10.1109/RELPHY.2005.1493171","DOIUrl":null,"url":null,"abstract":"A failure analysis process, combining electrical characterization, optical microscopy, SEM/FIB, and other analytical methods, to identify the root cause of pixel shorts in polymer light emitting diode (PLED) displays is presented. Shorted pixels appear black on a full-on white screen, influencing the display uniformity; they could also cause driver problems by drawing excess current. Pixel shorting also poses a reliability problem, since it can occur after burn-in, during the lifetime of the display. The paper discusses the FA process and identified failure mechanisms.","PeriodicalId":320150,"journal":{"name":"2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RELPHY.2005.1493171","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A failure analysis process, combining electrical characterization, optical microscopy, SEM/FIB, and other analytical methods, to identify the root cause of pixel shorts in polymer light emitting diode (PLED) displays is presented. Shorted pixels appear black on a full-on white screen, influencing the display uniformity; they could also cause driver problems by drawing excess current. Pixel shorting also poses a reliability problem, since it can occur after burn-in, during the lifetime of the display. The paper discusses the FA process and identified failure mechanisms.