Jyothish Soman, Negar Miralaei, A. Mycroft, Timothy M. Jones
{"title":"REPAIR: Hard-error recovery via re-execution","authors":"Jyothish Soman, Negar Miralaei, A. Mycroft, Timothy M. Jones","doi":"10.1109/DFT.2015.7315139","DOIUrl":null,"url":null,"abstract":"Processor reliability at upcoming technology nodes presents significant challenges to designers from increased manufacturing variability, parametric variation and transistor wear-out leading to permanent faults. We present a design to tolerate this impact at the microarchitectural level-a chip with n cores together with one or more shared instruction re-execution units (IRUs). Instructions using a faulty component are identified and re-executed on an IRU. This design incurs no slowdown in the absence of errors and allows continued operation of all n cores after multiple hard errors on one or all cores in the structures protected by our scheme. Experiments show that a single-core chip experiences only a 23% slowdown with 1 error, rising to 43% in the presence of 5 errors. In a 4-core scenario with 4 errors on every core and a shared IRU, REPAIR enables performance of 0.68× of a fully functioning system.","PeriodicalId":383972,"journal":{"name":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","volume":"167 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2015.7315139","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Processor reliability at upcoming technology nodes presents significant challenges to designers from increased manufacturing variability, parametric variation and transistor wear-out leading to permanent faults. We present a design to tolerate this impact at the microarchitectural level-a chip with n cores together with one or more shared instruction re-execution units (IRUs). Instructions using a faulty component are identified and re-executed on an IRU. This design incurs no slowdown in the absence of errors and allows continued operation of all n cores after multiple hard errors on one or all cores in the structures protected by our scheme. Experiments show that a single-core chip experiences only a 23% slowdown with 1 error, rising to 43% in the presence of 5 errors. In a 4-core scenario with 4 errors on every core and a shared IRU, REPAIR enables performance of 0.68× of a fully functioning system.