Distributed gate ESD network architecture for inter-power domain signals

Abstract

This paper examines the issue of transmitting signals between circuits of different power domains within an IC and the ESD sensitivity of the receiving logic's oxide in advanced processes. It is also shown that the ESD stress voltage appearing across a receiving gate's oxide can be distributed among several inverters. Also, design of interface attenuation networks that allow large voltage drops between domains for both CDM and HBM tests will be examined.