Investigation Regarding Thermal Resistance of Surface Mount Type Discrete Power Semiconductor Package

K. Nishi
{"title":"Investigation Regarding Thermal Resistance of Surface Mount Type Discrete Power Semiconductor Package","authors":"K. Nishi","doi":"10.1115/ipack2020-2631","DOIUrl":null,"url":null,"abstract":"\n Power electronics is becoming more important than before with motor application expansion. For size reduction of inverter integrated motor design, accurate temperature prediction of power devices is becoming critical. For up to several hundred-watt motor system, inverter is designed with discrete power devices with standard package. This paper investigates package thermal resistance of a DPAK package as an example. Firstly, three-dimensional heat conduction simulation only with DPAK package model is conducted. It is found that its package thermal resistance changes by ∼6.2°C/W due to boundary condition variation. After that, simulation not only with DPAK package but also with PCB is conducted to understand package thermal resistance of a real system implementation case. It is found that package thermal resistance varies drastically by copper trace size. “Smallest” case with minimum copper traces shows ∼0.9 °C/W higher value than larger copper trace case and shows ∼1.5 °C/W higher value than the case that copper trace fully covers PCB top surface, in the case that horizontal PCB size is 50 × 50 mm.\n After that, two types of test boards with different trace size for of n-channel MOSFET with DPAK package are prepared. Measurements are conducted to know package thermal resistance variation by copper trace size. Transient thermal impedance curve is obtained from measurement result and is converted to a cumulative Rth-Cth curve to know and discuss the difference by copper trace size of these two test boards. The difference is also discussed with and compared to that of simulation results.","PeriodicalId":199024,"journal":{"name":"ASME 2020 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ASME 2020 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1115/ipack2020-2631","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

Power electronics is becoming more important than before with motor application expansion. For size reduction of inverter integrated motor design, accurate temperature prediction of power devices is becoming critical. For up to several hundred-watt motor system, inverter is designed with discrete power devices with standard package. This paper investigates package thermal resistance of a DPAK package as an example. Firstly, three-dimensional heat conduction simulation only with DPAK package model is conducted. It is found that its package thermal resistance changes by ∼6.2°C/W due to boundary condition variation. After that, simulation not only with DPAK package but also with PCB is conducted to understand package thermal resistance of a real system implementation case. It is found that package thermal resistance varies drastically by copper trace size. “Smallest” case with minimum copper traces shows ∼0.9 °C/W higher value than larger copper trace case and shows ∼1.5 °C/W higher value than the case that copper trace fully covers PCB top surface, in the case that horizontal PCB size is 50 × 50 mm. After that, two types of test boards with different trace size for of n-channel MOSFET with DPAK package are prepared. Measurements are conducted to know package thermal resistance variation by copper trace size. Transient thermal impedance curve is obtained from measurement result and is converted to a cumulative Rth-Cth curve to know and discuss the difference by copper trace size of these two test boards. The difference is also discussed with and compared to that of simulation results.
表面贴装型分立功率半导体封装热阻研究
随着电机应用的扩大,电力电子技术变得比以前更加重要。为了减小逆变器集成电机的设计尺寸,功率器件的精确温度预测变得至关重要。对于高达几百瓦的电机系统,逆变器采用标准封装的分立功率器件设计。本文以DPAK封装的热阻为例进行了研究。首先,仅使用DPAK封装模型进行三维热传导仿真。发现由于边界条件的变化,其封装热阻变化了~ 6.2°C/W。然后,对DPAK封装和PCB进行了仿真,了解了一个实际系统实现案例的封装热阻。发现封装热阻随铜径线尺寸的变化有很大的差异。在水平PCB尺寸为50 × 50 mm的情况下,具有最小铜迹的“最小”情况的值比较大的铜迹情况高0.9°C/W,比铜迹完全覆盖PCB顶部表面的情况高1.5°C/W。然后,制备了两种不同走线尺寸的n沟道MOSFET DPAK封装测试板。通过测量来了解封装热阻随铜线尺寸的变化。根据测量结果得到暂态热阻抗曲线,并将其转换为累积的Rth-Cth曲线,从而了解和讨论两个测试板的铜走线尺寸差异。讨论了与仿真结果的差异,并进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信