Spectral and temporal phase measurement by optical frequency-domain reflectometry

Abstract

In the present work, we report on the spectral and temporal phase measurement capabilities of OFDR. Precise characterization of spectral phase information is demonstrated by retrieving the phase response of a commercial optical filter, the Finisar Waveshaper 1000 S/X programmable in attenuation and phase over C+L band (1530-1625 nm). Additionally, we demonstrate the high sensitivity of the technique to Doppler effects, enabling the use of OFDR for the characterization of dynamical aspects of optoelectronic components.