Atomistic analysis of the vacancy diffusion mechanism

S. List, H. Ryssel
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Abstract

There is still a large amount of disagreement concerning the basic diffusion mechanisms in silicon. Especially, there has been a long standing controversy about the macroscopic diffusion equations in case of the vacancy mechanism. In this paper we have performed calculations of the diffusion coefficient and the transport coefficient of the dopants that account for the actual crystal structure of silicon. The results depend on the modification of the vacancy potential energy in the vicinity of the dopant atom.
空位扩散机理的原子分析
关于硅中的基本扩散机制,目前还存在大量的分歧。特别是关于空位机制的宏观扩散方程一直存在争议。本文计算了影响硅晶体实际结构的掺杂剂的扩散系数和输运系数。结果取决于掺杂原子附近空位位能的变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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