High frequency characteristics of nanocomposite thin film "supercapacitors" and their suitability for embedded decoupling

P. Markondeya Raj, D. Balaraman, V. Govind, L. Wan, R. Abothu, R. Gerhardt, S. Bhattacharya, M. Swaminathan, R. Tummala
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引用次数: 5

Abstract

Embedded decoupling capacitor problem has been pursued by several groups and industry around the world over the past decade. Currently popular ceramic-polymer composites can only provide limited capacitance, typically within 10 nF/cm. With the reliability and processing constraints imposed, the capacitance density would be much lower. Newer capacitor concepts such as supercapacitors can overcome the limitations of existing polymer based capacitors and are now being considered by some groups. These concepts rely on nanostructured electrodes for high surface area per unit volume resulting in ultrahigh capacitance densities and unconventional polarization mechanisms such as electrical double layer and interfacial polarization. Supercapacitive structures lead to ultrahigh capacitance densities of the order of 100s of microfarads. However, manufacturers report that the properties are unstable at high frequencies, typically even at 10s of MHz. To adapt these structures for mid-to-high-frequency decoupling, it is hence essential to systematically characterize the high frequency dielectric properties of the thin nanocomposite films and nanostructured electrodes. This work reports complete electrical characterization of a part of such system, carbon black-epoxy nanocomposites. The high-frequency properties of the cured films were evaluated with a multiline calibration technique by measuring s-parameters of transmission lines fabricated on the top of the dielectrics. Though the nanostructured carbon black epoxy composites showed high dielectric constant of 1000 at low frequencies, the high frequency (0.5-4.5 GHz) dielectric constant was found to be only up to 10/spl times/ that of the base polymer matrix. The measured dielectric constant at GHz frequencies increased from 15-30 when the filler content was increased from 3.8 % to 6.5 %, with excessive leakage currents. Based on these measurements, conduction and polarization relaxation mechanisms will be assessed and the suitability of the thin film supercapacitors for high-frequency decoupling applications will be discussed.
纳米复合薄膜“超级电容器”的高频特性及其嵌入式去耦的适用性
近十年来,嵌入式去耦电容器问题一直受到国内外多个研究团体和行业的关注。目前流行的陶瓷-聚合物复合材料只能提供有限的电容,通常在10nf /cm以内。加上可靠性和工艺的限制,电容密度将大大降低。新的电容器概念,如超级电容器,可以克服现有的聚合物电容器的局限性,现在正在考虑一些团体。这些概念依赖于纳米结构电极的高单位体积表面积,从而产生超高电容密度和非常规极化机制,如电双层和界面极化。超级电容结构导致了高达100微法拉量级的超高电容密度。然而,制造商报告说,在高频下,即使在10s兆赫下,性能也不稳定。为了使这些结构适应中高频去耦,系统地表征纳米复合薄膜和纳米结构电极的高频介电特性是必不可少的。这项工作报告了该系统的一部分,碳黑-环氧纳米复合材料的完整电学表征。采用多线校准技术,通过测量在介质顶部制作的传输线的s参数来评估固化膜的高频特性。纳米结构碳黑环氧复合材料在低频时的介电常数高达1000,而在高频(0.5 ~ 4.5 GHz)时的介电常数仅为基体聚合物的10/spl倍。当填料含量从3.8%增加到6.5%时,在GHz频率下的介电常数从15 ~ 30增加,泄漏电流过大。基于这些测量,将评估传导和极化弛豫机制,并讨论薄膜超级电容器在高频去耦应用中的适用性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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