{"title":"Thermal challenges for heterogeneous 3D ICs and opportunities for air gap thermal isolation","authors":"Yang Zhang, Thomas E. Sarvey, M. Bakir","doi":"10.1109/3DIC.2014.7152174","DOIUrl":null,"url":null,"abstract":"Thermal crosstalk within a heterogeneous 3D IC results in higher temperatures for low-power dice; this is particularly true in memory-logic, photonic-logic, and MEMS-logic stacks. The elevated temperatures may consequently impact the performance of the low-power devices. This paper describes a thermal solution for both heat removal as well as thermal isolation within a 3D chip stack. Based on the evaluated memory-logic 3D architecture and compared to conventional air-cooling, the proposed technologies reduce the maximum temperature of the memory die from 75.6 °C to 36.7 °C and processor die from 75.9 °C to 60.1 °C.","PeriodicalId":231905,"journal":{"name":"2014 International 3D Systems Integration Conference (3DIC)","volume":"82 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 International 3D Systems Integration Conference (3DIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/3DIC.2014.7152174","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
Thermal crosstalk within a heterogeneous 3D IC results in higher temperatures for low-power dice; this is particularly true in memory-logic, photonic-logic, and MEMS-logic stacks. The elevated temperatures may consequently impact the performance of the low-power devices. This paper describes a thermal solution for both heat removal as well as thermal isolation within a 3D chip stack. Based on the evaluated memory-logic 3D architecture and compared to conventional air-cooling, the proposed technologies reduce the maximum temperature of the memory die from 75.6 °C to 36.7 °C and processor die from 75.9 °C to 60.1 °C.