TID/SEE Tests of the Radiation Hardened DDR2 SDRAM Memory Solution

2016 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2016-07-11 DOI:10.1109/NSREC.2016.7891748

Pierre Wang, C. Sellier, Pierre Southiratn, D. Nguyen, K. Grurmann

引用次数: 2

Abstract

We report on results of TID/SEL/SEU/SEFI tests of a state of the art RH DDR2-SDRAM Memory solution. The hard errors (TID/SEL) verified at die level, and soft errors (SEU/SEFI) verified at system level.

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辐射强化DDR2 SDRAM内存解决方案的TID/SEE测试

我们报告最新的RH DDR2-SDRAM内存解决方案的TID/SEL/SEU/SEFI测试结果。硬错误(TID/SEL)在模具级验证，软错误(SEU/SEFI)在系统级验证。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2016 IEEE Radiation Effects Data Workshop (REDW)

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