Reliability Study of Wire Bonds to Silver Plated Surfaces

K. James
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引用次数: 22

Abstract

The influence of temperature and environment on bond integrity was investigated for both aluminum ultrasonic and gold thermocompression wire bonds made to silver plate. Storage of aluminum-silver bonds at 85°C-8S-percent relative humidity (85/85) (no bias) resulted in progressive bond strength degradation and a shift in the primary failure mode from wire breaks to bond lifts. Degradation was attributed to massive aluminum corrosion. Bond degradation was not observed for the gold-silver system during storage at 85/85 (no bias) for 1500 h. In addition to humidity testing, gold-silver bonds were isothermally aged at 150, 250, 350, 450, and 540°C for a minimum of 10 min at each temperature to a maximum of 2000 h at 150°C, 1500 h at 250 and 350°C, 1000 h at 450°C, and 500 h at 540°C. Although rapid silver diffusion was observed in samples aged above 150°C, the system was determined to be mechanically reliable. An effective silver diffusion coefficient for the wire bond system was calculated from destructive wire pull data and was found to obey the equation
镀银表面线键的可靠性研究
研究了温度和环境对铝超声和金热压焊丝与银板的结合完整性的影响。在85°c - 8s - %相对湿度(85/85)(无偏置)下储存铝银键会导致键合强度逐渐下降,主要失效模式从断线转变为键合脱落。降解是由于铝的大量腐蚀。在85/85(无偏置)条件下储存1500小时,未观察到金-银体系的键降解。除了湿度测试外,金-银键在150、250、350、450和540℃等温老化,每种温度下至少10分钟,在150℃下最长时效2000小时,在250和350℃下最长时效1500小时,在450℃下最长时效1000小时,在540℃下最长时效500小时。虽然在150°C以上的样品中观察到银的快速扩散,但确定该系统在机械上是可靠的。利用破坏性拉丝数据计算了金属键合体系的有效银扩散系数,发现其符合方程
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